Study the Effect of Thickness on the Optical Properties of Copper Oxide Thin Films by FDTD Method
Main Article Content
Abstract
In this work, we present the optical modeling results of film thickness effect on the optical properties of CuO thin film based devices. The finite-difference time-domain (FDTD) method were used to predict the optical properties of CuO thin films on glass substrate with deferent thicknesses (100 nm- 3 µm). The absorption, transmittance, and reflectance are detected over a wavelength range of 300–800 nm. FDTD simulation results indicated that the optical absorption increased with increasing CuO film's thickness. In addition, a numerical simulation predicted that the CuO active layer with thickness 1.5 µm has a higher absorption spectrum. On the other hand, the further increase of CuO thickness (2, 2.5, and 3 µm) showed no more effect on the absorptance, where their absorption spectra behave similarly to each other. This study can be useful to develop highly efficient and low cost thin film based optoelectronic devices.
Downloads
Metrics
Article Details
Licensing
TURCOMAT publishes articles under the Creative Commons Attribution 4.0 International License (CC BY 4.0). This licensing allows for any use of the work, provided the original author(s) and source are credited, thereby facilitating the free exchange and use of research for the advancement of knowledge.
Detailed Licensing Terms
Attribution (BY): Users must give appropriate credit, provide a link to the license, and indicate if changes were made. Users may do so in any reasonable manner, but not in any way that suggests the licensor endorses them or their use.
No Additional Restrictions: Users may not apply legal terms or technological measures that legally restrict others from doing anything the license permits.
