et. al. DKMP. A Robustand Dynamic Fault Detectionand Classficationof Semi-Conductorsusing Logistic Regression. TURCOMAT [Internet]. 2021 Apr. 28 [cited 2025 Nov. 7];12(10):5911-4. Available from: https://turcomat.org/index.php/turkbilmat/article/view/5411