KUMARI, K. P.; ADHILAKSHMI, G.; GOUD, C. S. Efficient ATPG Technique for Multiple Single Input Change Test Designs in BIST for Improved Fault Coverage and Reduced Test Time. Turkish Journal of Computer and Mathematics Education (TURCOMAT), [S. l.], v. 12, n. 12, p. 4930–4935, 2021. DOI: 10.17762/turcomat.v12i12.14238. Disponível em: https://turcomat.org/index.php/turkbilmat/article/view/14238. Acesso em: 22 jul. 2024.