A Review on Methods used to determine Fractal Dimension Analysis of AFM Images of Thin Film
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Abstract
This aims the applications in the field of surface analysis and study of structure of different materials. The purpose
of this examination is to additionally research the ultra-structural details of the surface of thin film using atomic
force microscopy (AFM) images. The fractal dimension, gave quantitative qualities that describe the scale
properties of surface geometry. Detailed identification of the surface geometry was obtained using statistical
parameters. The analyzed AFM images confirm a fractal nature of the surface, which is not taken into account by
classical surface statistical parameters. In this paper, we present a review on different methods used to determine
fractal dimension of AFM images of thin film.
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